Inverse analysis of pre- and post-impact dynamics for vehicle accident reconstructionINHWAN HAN; PARK, Sang-Uk.Vehicle System Dynamics. 2001, Vol 36, Num 6, pp 413-433, issn 0042-3114Article

Two-step optical annealing effects on spin-coated InAl-doped ZnO thin filmsPARK, Sang-Uk; KOH, Jung-Hyuk.Journal of alloys and compounds. 2014, Vol 615, pp 1032-1036, issn 0925-8388, 5 p.Article

Temporal Feature Modulation for Video WatermarkingLEE, Young-Yoon; PARK, Sang-Uk; KIM, Chang-Su et al.IEEE transactions on circuits and systems for video technology. 2009, Vol 19, Num 4, pp 603-608, issn 1051-8215, 6 p.Article

CDV-DVC: Transform-domain distributed video coding with multiple channel divisionPARK, Sang-Uk; LEE, Young-Yoon; KIM, Chang-Su et al.Journal of visual communication and image representation. 2013, Vol 24, Num 5, pp 534-543, issn 1047-3203, 10 p.Article

Analysis of reliability characteristics of high capacitance density MIM capacitors with SiO₂―HfO₂―SiO₂ dielectricsPARK, Sang-Uk; KANG, Chang-Yong; KWON, Hyuk-Min et al.Microelectronic engineering. 2011, Vol 88, Num 12, pp 3389-3392, issn 0167-9317, 4 p.Conference Paper

Characterization of Random Telegraph Signal Noise of High-Performance p-MOSFETs With a High-k Dielectric/Metal GateKWON, Hyuk-Min; HAN, In-Shik; JAMMY, Raj et al.IEEE electron device letters. 2011, Vol 32, Num 5, pp 686-688, issn 0741-3106, 3 p.Article

Blind watermarking for authentication of 3-D QSplat modelsPARK, Sang-Uk; LEE, Young-Yoon; KIM, Chang-Su et al.Proceedings of SPIE, the International Society for Optical Engineering. 2006, pp 639111.1-639111.9, issn 0277-786X, isbn 0-8194-6489-9, 1VolConference Paper

Analysis of trap effect on reliability using the charge pumping technology in La-incorporated high-k dielectricsKWON, Hyuk-Min; CHOI, Won-Ho; HAN, In-Shik et al.Microelectronic engineering. 2011, Vol 88, Num 12, pp 3415-3418, issn 0167-9317, 4 p.Conference Paper

Carrier transport mechanism in La-incorporated high-κ dielectric/metal gate stack MOSFETsKWON, Hyuk-Min; CHOI, Won-Ho; HAN, In-Shik et al.Microelectronic engineering. 2011, Vol 88, Num 12, pp 3399-3403, issn 0167-9317, 5 p.Conference Paper